cosine High Energy Optics creates new systems and methods for high energy detection in a wide range of techniques. Our core products are listed below.

Many other techniques are available such as x-ray diffraction, glass millipore optics and high energy particle/gamma ray counting. Please contact us for more information.
SPO stack

SPO
Silicon Pore Optics

The new generation, lightweight, high resolution X-ray optics

The SPO optics are modules that consist of stacked X-ray mirrors that together form a small X-ray lens. Due to the light passing through hollow pores, the modules have very low mass compared to other X-ray optics technology with similar imaging resolution. Coatings on the silicon allow for high energy X-ray and Gamma ray focussing.
A larger or smaller number of these modules can be combined to form a full X-ray lens for X-ray astronomy and ground-based X-ray instrumentation.

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XRI

XRI
X-Ray interferometer

Separating extremely small angles

The SPO mirror technique is capable of the required extreme precision in allignment needed for interferometric imaging.

Using interferometry, unprecedented angular resolution can be achieved of  1 million times compared to simple lensing.

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SiLC
Silicon Laue Lens components

Optics for very hard X-Ray and Gamma rays. 

In the very high energy range, the solution of mirroring is not possible, as the maximum reflective angle becomes too small. In this case using  a Laue lens is the preferred solution.

Using the interference between the different angles through a bend or mosaic crystal, imaging can be achieved where it is not otherwise possible. Using an SPO based techniques, where bend and wedged single chrystal Silicon plates are stacked without pores, allows for superior Silicon Laue lensing.

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xrt stack beam

XRT
High-energy optics simulation

Quickly determine realistic system performance and features

The high energy optics software simulates X-ray and gamma-ray imaging systems based on grazing incidence scattering using the Monte Carlo technique. The software offers control of the surface properties and scattering processes at each individual interaction.

Additionally, the geometry of the surfaces and the imaging system,as well as the incoming beam and the resulting images patterns on the detector surface are fully under control of the user.

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